[visionlist] [CFP - The IEEE Computer Magazine]: Special Issue on ‘Five decades of Biometrics and Video Surveillance: Present Technologies and Future Possibilities’

Vitomir Struc vitomir.struc at fe.uni-lj.si
Mon Feb 14 03:51:54 -04 2022

CALL FOR PAPERS - SI in the IEEE Computer Magazine
SI Title: Five decades of Biometrics and Video Surveillance: Present 
Technologies and Future Possibilities

*** Aims and Objectives ***

Biometrics and visual surveillance emerged as the two most promising 
application areas of classical image and video processing. These areas 
have seen a paradigm shift from basic application limited to a computer, 
to as large as pan-nation application. Biometrics and surveillance find 
applications in commercial, government, and forensics. Depending on 
various usage and coverage, the biometric system and visual surveillance 
systems are also designed very differently. The progress in these fields 
is very inclusive in terms of engaging research towards reducing sensor 
sizes, optimizing algorithms, tackling huge databases, providing 
real-time reports etc.
This special issue commemorates the five decades of biometric and visual 
surveillance and will focus on presenting new and incremental research 
depicting present biometric and surveillance technologies and future 
possibilities of them for the current and future generations.

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*** Topics of Interest ***

The topics include, but are not limited to:
+ Present methodologies for biometrics and their limitations
+ Mobile biometrics
+ Cancelable and soft biometrics
+ Cyber physical systems for cloud based surveillance
+ Multi-camera network for surveillance
+ Surveillance over smart affective environments
+ Biometrics and Surveillance in Industry 4.0
+ Biometrics-as-a-Service
+ Legal, ethical, and regulation factors for biometrics and surveillance

*** Timeline ***
Paper Submission Due: April 15, 2022
First Review Notification: July 01, 2022
Revision Submission: August 01, 2022
Acceptance Notification: September 15, 2022

*** Guest Editors ***
Sambit Bakshi, National Institute of Technology Rourkela, India
Irena Bojanova, NIST, USA
Vitomir Štruc, University of Ljubljana, Slovenia
George K. Thiruvathukal, Loyola University Chicago, USA
Maria De Marsico, Sapienza University, Italy

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